X-Rite photo

Date Created: 8/2/2006   Date Modified: 6/8/2012

+Low Test Chart Resolution Checkbox in ProfileMaker

This option was added in version 5.0 for use with the Eye-One iO. It can be used when measuring test charts printed with a low resolution output device. It slows down the operation of the instrument allowing it to gather more data points. The other option is to use the iO in patch mode.